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2011 Joint AAPM/COMP Meeting - Session: Imaging Educational Course - Radiography III

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Understanding Exposure and Deviation Indices Mr. David L Leong, MSc, Analogic Corporation, Peabody, MA, 1960, United States Handout(s): 59-17262-70888-306.pdf  59-17262-98710-820.pdf

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Understanding Exposure and Deviation Indices - Jeff Shepard, MS

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