Program Information
Ionization Chamber Perturbation in Flattening Filter Free Beams
D Czarnecki1 , P von Voigts-Rhetz1 , K Zink1,2*, (1) Technische Hochschule Mittelhessen - University of Applied Sciences, Giessen, Germany, (2) Germany and Department of Radiotherapy and Radiooncology, University Medical Center Giessen-Marburg, Marburg, Germany
Presentations
SU-E-T-525 (Sunday, July 12, 2015) 3:00 PM - 6:00 PM Room: Exhibit Hall
Purpose:
Changing the characteristic of a photon beam by mechanically removing the flattening filter may impact the dose response of ionization chambers. Thus, perturbation factors of cylindrical ionization chambers in conventional and flattening filter free photon beams were calculated by Monte Carlo simulations.
Methods:
The EGSnrc/BEAMnrc code system was used for all Monte Carlo calculations. BEAMnrc models of nine different linear accelerators with and without flattening filter were used to create realistic photon sources. Monte Carlo based calculations to determine the fluence perturbations due to the presens of the chambers components, the different material of the sensitive volume (air instead of water) as well as the volume effect were performed by the user code egs_chamber.
Results:
Stem, central electrode, wall, density and volume perturbation factors for linear accelerators with and without flattening filter were calculated as a function of the beam quality specifier TPR20/10.
A bias between the perturbation factors as a function of TPR20/10 for flattening filter free beams and conventional linear accelerators could not be observed for the perturbations caused by the components of the ionization chamber and the sensitive volume.
Conclusion:
The results indicate that the well-known small bias between the beam quality correction factor as a function of TPR20/10 for the flattening filter free and conventional linear accelerators is not caused by the geometry of the detector but rather by the material of the sensitive volume. This suggest that the bias for flattening filter free photon fields is only caused by the different material of the sensitive volume (air instead of water).
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