Program Information
Iterative Reconstruction in CT
K Myers
K Stierstorfer
J Hsieh
W Wang
S Halliburton
N Pelc
K Myers1*, K Stierstorfer2*, J Hsieh3*, W Wang4*, S Halliburton5*, N Pelc6*, (1) Office of Science and Engineering Laboratories,FDA, Silver Spring, MD, (2) Siemens, Forchheim, Germany, (3) GE Healthcare Technologies, Brookfield, WI, (4) Toshiba Medical Research Institute USA, Vernon Hills, IL, (5) Philips Healthcare, Cleveland, OH, (6) Stanford University, Stanford, CA
Presentations
MO-DE-204-0 (Monday, July 13, 2015) 1:45 PM - 3:45 PM Room: 204
A great deal of progress has been made in iterative/statistical image reconstruction for x-ray CT, and major vendors have products available for their systems. These image reconstruction algorithms are nonlinear, and therefore present challenges related to image quality evaluation. For example, pixel noise standard deviation is likely not to correlate to perceived image quality and spatial resolution is likely to be contrast dependent. The purpose of this symposium is to inform medical physicists on these challenges and what methods are available for judging image quality and improvements. Following this background, speakers will describe the methods that are available on various commercial systems.
The symposium consists of:
Kyle Myers: “Evaluation of Nonlinear Reconstruction Methods
Karl Stierstorfer: “Advanced Reconstruction Methods on Siemens CT Systems"
Jiang Hsieh: “Advanced Reconstruction Methods on GE CT Systems"
Wenli Wang: “Advanced Reconstruction Methods on Toshiba CT Systems"
Sandra Halliburton: “Advanced Reconstruction Methods on Philips CT Systems”
Panel Discussion
Learning Objectives:
1. Challenges and methods for evaluating image quality in nonlinear systems
2. Understand the advanced reconstruction methods available on commercial systems
3. Understand the benefits provided by the advanced reconstruction techniques
Funding Support, Disclosures, and Conflict of Interest: Research support: Philips Healthcare and GE Healthcare
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