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MO-E-332-7 |
Instrumentation Noise Equivalent Exposure (INEE) for Routine Quality Assurance: INEE Measurements On a Clinical Flat Panel Detector |
| Byline |
T Szczykutowicz *, A Kuhls-Gilcrist , D Bednarek , S Rudin , University at Buffalo, Toshiba Stroke Research Center, Buffalo, NY
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| Contact
Email |
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| Document Files |
| Proffered Abstract |
35-8889-78645-207.pdf |
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