TH-C-L100F-2 |
Instrumentation Noise Equivalent Exposure (INEE) and the Effect of Detector Blurring and Image Post-Process Smoothing: A Simulation Study |
Byline |
G Yadava*, S Rudin, A Kuhls, D Bednarek, Toshiba Stroke Research Center, University at Buffalo (SUNY), Buffalo, NY
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Contact
Email |
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Document Files |
Proffered Abstract |
29-6838-15244-124.pdf |
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